Search for: All records

In this article, the optimal sample complexity of learning the underlying interactions or dependencies of a Linear Dynamical System (LDS) over a Directed Acyclic Graph (DAG) is studied. We call such a DAG underlying an LDS as dynamical DAG (DDAG). In particular, we consider a DDAG where the nodal dynamics are driven by unobserved exogenous noise sources that are wide-sense stationary (WSS) in time but are mutually uncorrelated, and have the same power spectral density (PSD). Inspired by the static DAG setting, a metric and an algorithm based on the PSD matrix of the observed time series are proposed to reconstruct the DDAG. It is shown that the optimal sample complexity (or length of state trajectory) needed to learn the DDAG is n = Θ(q log(p/q)), where p is the number of nodes and q is the maximum number of parents per node. To prove the sample complexity upper bound, a concentration bound for the PSD estimation is derived, under two different sampling strategies. A matching min-max lower bound using generalized Fano’s inequality also is provided, thus showing the order optimality of the proposed algorithm. The codes used in the paper are available at https://github.com/Mishfad/Learning-Dynamical-DAGs 

This article analyzes the effect of imperfections in physically realizable memory. Motivated by the realization of a bit as a Brownian particle within a double well potential, we investigate the energetics of an erasure protocol under a Gaussian mixture model. We obtain sharp quantitative entropy bounds that not only give rigorous justification for heuristics utilized in prior works, but also provide a guide toward the minimal scale at which an erasure protocol can be performed. We also compare the results obtained with the mean escape times from double wells to ensure reliability of the memory. The article quantifies the effect of overlap of two Gaussians on the the loss of interpretability of the state of a one bit memory, the required heat dissipated in partially successful erasures and reliability of information stored in a memory bit.